Microcontroller Based Instrument having range 190 to 1100 nm with 24x2 line LCD display, two quartz cuvettes, 18 touch keys, base lines correction, source optimization & electronic calibration etc. It has facility for measurement of % T, Abs. Conc, K-Factor and multi component analysis. The operating modes are single/multi wavelength, wavelength scan, time scan etc.
Technical Data:
Spectral
Range: 190 nm - 1100 nm
Bandwidth: 2 nm
Accuracy: ±0.5 nm
Readability: 0.1 nm
Repeatability: ±0.2 nm
Photometric
System: Double beam optics
Range: Abs : 0 to ±3.000, % T : 0 to 100.0%
Accuracy: ± 0.005 Abs at 1.0 Abs, ± 0.010 Abs at 1.5 Abs
Repeatability: 0.002 Abs at 1.5 Abs
Stray Light: < 0.1% T at 260 nm with KI 10 g/I
Readability: % T : 0.1, Abs : 0.001
Light Source: Deuterium (D2) & Tungsten (W) Halogen Lamps
Monochromator: Czerny - Turner type with 1200 lines per mm
Detector: Wide range highly sensitive photodiode
Operational
Baseline Correction: Automatic baseline correction
Measuring Mode: Scan (Absorbance & Transmission), Photometric (Multi l & Serial ) Concentration & Time Scan (Kinetics)
Scan Speed: Slow, Medium & Fast
Scan Interval: 5 - 99 seconds
Sample Holder: Automatic 6 - position cuvette holder for 10 mm path length cuvettes
Filters: Auto, in - built filter wheel
Data Storage: 1000 Samples Storage Memory.